[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Advanced simulation of statistical variability and reliability in nano CMOS transistors
Asenov, A., Roy, S., Brown, R. A., Roy, G., Alexander, C., Riddet, C., Millar, C., Cheng, B., Martinez, A., Seoane, N., Reid, D., Bukhori, M. F., Wang, X., Kovac, U.Рік:
2008
Мова:
english
DOI:
10.1109/iedm.2008.4796712
Файл:
PDF, 1.18 MB
english, 2008