[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - Substrate triggering and salicide effects on ESD performance and protection circuit design in deep submicron CMOS processes
Amerasekera, A., Duvvury, C., Reddy, V., Rodder, M.Рік:
1995
Мова:
english
DOI:
10.1109/iedm.1995.499280
Файл:
PDF, 350 KB
english, 1995
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