NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
Lin, Chia-Sheng, Chen, Ying-Chung, Chang, Ting-Chang, Jian, Fu-Yen, Hsu, Wei-Che, Kuo, Yuan-Jui, Dai, Chih-Hao, Chen, Te-Chih, Lo, Wen-Hung, Hsieh, Tien-Yu, Shih, Jou-MiaoТом:
32
Мова:
english
Журнал:
IEEE Electron Device Letters
DOI:
10.1109/led.2011.2144953
Date:
July, 2011
Файл:
PDF, 399 KB
english, 2011