[IEEE 2012 IEEE 16th International Conference on Computer Supported Cooperative Work in Design (CSCWD) - Wuhan, China (2012.05.23-2012.05.25)] Proceedings of the 2012 IEEE 16th International Conference on Computer Supported Cooperative Work in Design (CSCWD) - A new morphology-based approach for similarity searching on wafer bin maps in semiconductor manufacturing
Hsieh, Tsung-Jung, Liao, Chung-Shou, Huang, Yu-Syuan, Chien, Chen-FuРік:
2012
Мова:
english
DOI:
10.1109/cscwd.2012.6221923
Файл:
PDF, 1.43 MB
english, 2012