Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)
Valsecchi, Nicolas, Gloutnay, Eric, Pellerin, Tony, Cusson, Jean-FranÇois, Lafrance, SÉbastien, Hardy, Julie, Brassard, GillesТом:
56
Мова:
english
Журнал:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2032864
Date:
December, 2009
Файл:
PDF, 1.09 MB
english, 2009
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