[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Unified regional modeling approach to emerging multiple-gate/nanowire MOSFETs
Zhou, Xing, See, Guan Huei, Zhu, Guojun, Lin, Shihuan, Wei, Chengqing, Zhang, JunbinРік:
2008
Мова:
english
DOI:
10.1109/icsict.2008.4734529
Файл:
PDF, 2.47 MB
english, 2008