In Situ Transmission Electron Microscopy Probing of Native Oxide and Artificial Layers on Silicon Nanoparticles for Lithium Ion Batteries
He, Yang, Piper, Daniela Molina, Gu, Meng, Travis, Jonathan J., George, Steven M., Lee, Se-Hee, Genc, Arda, Pullan, Lee, Liu, Jun, Mao, Scott X., Zhang, Ji-Guang, Ban, Chunmei, Wang, ChongminТом:
8
Мова:
english
Журнал:
ACS Nano
DOI:
10.1021/nn505523c
Date:
November, 2014
Файл:
PDF, 5.32 MB
english, 2014