Direct correlation between reliability and pH changes of phosphors for white light-emitting diodes
Choi, Minho, Kim, Ki Hyun, Yun, Changhun, Koo, Dai Hyoung, Song, Sang Bin, Kim, Jae PilТом:
54
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.07.141
Date:
December, 2014
Файл:
PDF, 696 KB
english, 2014
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