[IEEE 2008 19th International Conference on Pattern Recognition (ICPR) - Tampa, FL, USA (2008.12.8-2008.12.11)] 2008 19th International Conference on Pattern Recognition - Non-Abelian invariant feature detection
Gur, Yaniv, Sochen, NirРік:
2008
Мова:
english
DOI:
10.1109/icpr.2008.4761230
Файл:
PDF, 128 KB
english, 2008