[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Using Local Affine Invariants to Improve Image Matching
Fleck, Daniel, Duric, ZoranРік:
2010
Мова:
english
DOI:
10.1109/icpr.2010.455
Файл:
PDF, 741 KB
english, 2010