[IEEE 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Beijing, China (2010.04.12-2010.04.16)] 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility - Alteration of BBB tight junction protein expression induced by EMP exposure
Ding, Gui-Rong, Lian-Bo Qiu,, Kang-Chu Li,, Wang, Xiao-Wu, Yong-Chun Zhou,, Yan Zhou,, Jun-ye Liu,, Yu-Rong Li,, Guo, Guo-ZhenРік:
2010
Мова:
english
DOI:
10.1109/apemc.2010.5475732
Файл:
PDF, 666 KB
english, 2010
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