A new automatic contact point detection algorithm for AFM force curves
BenÍtez, Rafael, Moreno-flores, Susana, BolÓs, Vicente J., Toca-Herrera, JosÉ LuisТом:
76
Мова:
english
Журнал:
Microscopy Research and Technique
DOI:
10.1002/jemt.22241
Date:
August, 2013
Файл:
PDF, 446 KB
english, 2013