Influence of ac contact impedance on high-frequency, low-temperature, or fast-transient junction measurements in semiconductors
Shiau, Jeng-Jye, Fahrenbruch, Alan L., Bube, Richard H.Том:
61
Рік:
1987
Мова:
english
Журнал:
Journal of Applied Physics
DOI:
10.1063/1.338090
Файл:
PDF, 865 KB
english, 1987