[IEEE 19th International Symposium on Power Semiconductor Devices and IC's - Jeju, Korea (2007.05.27-2007.05.31)] Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's - Influence of the base contact on the electrical characteristics of SiC BJTs
Lee, Hyung-Seok, Domeij, Martin, Zetterling, Carl-Mikael, Ostling, Mikael, Heinze, Birk, Lutz, JosefРік:
2007
Мова:
english
DOI:
10.1109/ispsd.2007.4294955
Файл:
PDF, 2.56 MB
english, 2007
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