[IEEE 2007 International Conference on Mechatronics and Automation - Harbin, China (2007.08.5-2007.08.8)] 2007 International Conference on Mechatronics and Automation - Depth-Detection Methods for CNT Manipulation and Characterization in a Scanning Electron Microscope
Fatikow, Sergej, Eichhorn, Volkmar, Wich, Thomas, Sievers, Torsten, HanBler, Olaf, Andersen, Karin NordstromРік:
2007
Мова:
english
DOI:
10.1109/icma.2007.4303514
Файл:
PDF, 1.61 MB
english, 2007
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