Reliability of pFET EEPROM With 70-Å Tunnel Oxide Manufactured in Generic Logic CMOS Processes
Ma, Y., Gilliland, T., Wang, B., Paulsen, R., Pesavento, A., Wang, C.-H., Nguyen, H., Humes, T., Diorio, C.Том:
4
Мова:
english
Журнал:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2004.837119
Date:
September, 2004
Файл:
PDF, 466 KB
english, 2004