Feature-scale model of Si etching in SF[sub 6] plasma and comparison with experiments
Belen, Rodolfo Jun, Gomez, Sergi, Kiehlbauch, Mark, Cooperberg, David, Aydil, Eray S.Том:
23
Рік:
2005
Мова:
english
Журнал:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1830495
Файл:
PDF, 756 KB
english, 2005