[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Simulation of Carbon nanotube FETs including hot-phonon and self-heating effects
Hasan, Sayed, Alam, Muhammad Ashraful, Lundstrom, MarkРік:
2006
Мова:
english
DOI:
10.1109/iedm.2006.346738
Файл:
PDF, 823 KB
english, 2006