[IEEE 2008 International Conference on Innovations in Information Technology (IIT) - Al Ain, United Arab Emirates (2008.12.16-2008.12.18)] 2008 International Conference on Innovations in Information Technology - A Bayesian based EDA tool for accurate VLSI reliability evaluations
Ibrahim, Walid, Beg, Azam, Amer, HodaРік:
2008
Мова:
english
DOI:
10.1109/innovations.2008.4781735
Файл:
PDF, 469 KB
english, 2008