[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - On efficient error-tolerability evaluation and maximization for image processing applications
Hsieh, Tong-Yu, Li, Kuan-Hsien, Peng, Yi-HanРік:
2014
Мова:
english
DOI:
10.1109/vlsi-dat.2014.6834866
Файл:
PDF, 1.17 MB
english, 2014