Investigation of Grain Boundary Diffusion in Thin Films by SNMS Technique
Beke, D.L., Lakatos, A., Erdélyi, G., Makovecz, A., Langer, G.A., Daróczi, Lajos, Vad, K., Csik, A.Том:
312-315
Мова:
english
Журнал:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/ddf.312-315.1208
Date:
April, 2011
Файл:
PDF, 732 KB
english, 2011