[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - FinFET SONOS flash memory for embedded applications
Peiqi Xuan,, Min She,, Harteneck, B., Liddle, A., Bokor, J., King, T.-J.Рік:
2003
Мова:
english
DOI:
10.1109/iedm.2003.1269355
Файл:
PDF, 306 KB
english, 2003