Effect of deposition parameters on exchange bias studied using lorentz and high-resolution electron microscopy
Ramadurai, B., Smith, D.J.Том:
39
Мова:
english
Журнал:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2003.815579
Date:
September, 2003
Файл:
PDF, 393 KB
english, 2003