Comprehensive Studies on the Carrier Transporting Property and Photo-Bias Instability of Sputtered Zinc Tin Oxide Thin Film Transistors
Lee, Hong Woo, Yang, Bong Seob, Kim, Yoon Jang, Hwang, Ah Young, Oh, Seungha, Lee, Jong Hwan, Jeong, Jae Kyeong, Kim, Hyeong JoonТом:
61
Мова:
english
Журнал:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2337307
Date:
September, 2014
Файл:
PDF, 1.71 MB
english, 2014
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