[IEEE 2010 Ninth IEEE Sensors Conference (SENSORS 2010) - Kona, HI (2010.11.1-2010.11.4)] 2010 IEEE Sensors - Sensitivity of point defects in one dimensional nanocircuits
Hunt, Steven R, Hoang, Phuc D, Khalap, Vaikunth R, Wan, Danny, Corso, Brad L, Collins, Philip GРік:
2010
Мова:
english
DOI:
10.1109/icsens.2010.5690224
Файл:
PDF, 1.41 MB
english, 2010