[IEEE 2006 International Conference on Dependability of Computer Systems - Szklarska Poreba (2006.05.25-2006.05.27)] 2006 International Conference on Dependability of Computer Systems - Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
Micskei, Zoltan, Majzik, IstvanРік:
2006
Мова:
english
DOI:
10.1109/depcos-relcomex.2006.37
Файл:
PDF, 394 KB
english, 2006