[IEEE 2014 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2014) - Paris, France (2014.7.14-2014.7.18)] 2014 IEEE Radiation Effects Data Workshop (REDW) - Characterization and Analyses of RadHard-By-Design CMOS Open Drain Quad Comparators
Benson, Ray, Resch, Paul, Milanowski, Randall, Swonger, JamesРік:
2014
Мова:
english
DOI:
10.1109/redw.2014.7004555
Файл:
PDF, 1.03 MB
english, 2014
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