[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Advanced Application of Resistivity and Hall Effect Measurements to Characterization of Silicon
Voronkov, Vladimir V., Voronkova, Galina I., Batunina, Anna V., Falster, RobertРік:
2009
Мова:
english
DOI:
10.1149/1.3204391
Файл:
PDF, 382 KB
english, 2009