[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Challenge of MOS/MTJ-hybrid nonvolatile logic-in-memory architecture in dark-silicon era
Hanyu, Takahiro, Suzuki, Daisuke, Mochizuki, Akira, Natsui, Masanori, Onizawa, Naoya, Sugibayashi, Tadahiko, Ikeda, Shoji, Endoh, Tetsuo, Ohno, HideoРік:
2014
Мова:
english
DOI:
10.1109/iedm.2014.7047124
Файл:
PDF, 3.08 MB
english, 2014
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