Material Defects and Rugged Electrical Power Switching in Semiconductors
Shenai, Krishna, Neudeck, Philip G., Dudley, M., Davis, Robert F.Том:
717-720
Мова:
english
Журнал:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.1077
Date:
May, 2012
Файл:
PDF, 495 KB
english, 2012