SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Machine Vision Applications in Industrial Inspection XIV - Aerial platform attitude measurement by artificial vision
Truchetet, F., Aubreton, O., Gorria, P., Laligant, O., Meriaudeau, Fabrice, Niel, Kurt S.Том:
6070
Рік:
2006
Мова:
english
DOI:
10.1117/12.642090
Файл:
PDF, 336 KB
english, 2006