SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical System Alignment, Tolerancing, and Verification VII - A new approach for the verification of optical systems
Siddique, Umair, Aravantinos, Vincent, Tahar, Sofiène, Sasián, José, Youngworth, Richard N.Том:
8844
Рік:
2013
Мова:
english
DOI:
10.1117/12.2024860
Файл:
PDF, 1.25 MB
english, 2013