SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 22 January 2012)] Three-Dimensional Image Processing (3DIP) and Applications II - Multidirectional four-dimensional shape measurement system
Lenar, Janusz, Baskurt, Atilla M., Sitnik, Robert, Sitnik, Robert, Witkowski, MarcinТом:
8290
Рік:
2012
Мова:
english
DOI:
10.1117/12.907706
Файл:
PDF, 3.11 MB
english, 2012