Use of waveguide light scattering for precision measurements of the statistical parameters of irregularities of integrated optical waveguide materials
Yegorov, Alexandre A.Том:
44
Мова:
english
Журнал:
Optical Engineering
DOI:
10.1117/1.1828469
Date:
January, 2005
Файл:
PDF, 254 KB
english, 2005