Evolution of Residual Micro Phase and Orientation Dependent Stresses during Cold Wire Drawing
Kriška, Martin, Tacq, Jeroen, van Acker, Karel, Seefeldt, MarcТом:
768-769
Мова:
english
Журнал:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.768-769.327
Date:
September, 2013
Файл:
PDF, 695 KB
english, 2013