[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - An embedded ReRAM using a small-offset sense amplifier for low-voltage operations
Lee, Albert, Lin, Chien-Chen, Yang, Ting-Chin, Chang, Meng-FanРік:
2015
Мова:
english
DOI:
10.1109/vlsi-dat.2015.7114532
Файл:
PDF, 783 KB
english, 2015