Reliability LU Appropriate Designs in an HV nLDMOS
Chen, Shen Li, Wu, Tzung ShianТом:
271-272
Мова:
english
Журнал:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/AMM.271-272.1082
Date:
December, 2012
Файл:
PDF, 398 KB
english, 2012