Characterization of evaporated silicon and silicon monoxide films by inelastic electron tunneling spectroscopy
Higo, Morihide, Nishino, Kouichi, Kamata, SatsuoТом:
96
Мова:
english
Журнал:
The Journal of Physical Chemistry
DOI:
10.1021/j100183a062
Date:
February, 1992
Файл:
PDF, 938 KB
english, 1992