Yield improvement and yield variability reduction in an eoq model with planned shortages and random yield
Paknejad, Javad, Nasri, Farrokh, Affisco, John F.Мова:
english
Журнал:
Computers & Industrial Engineering
DOI:
10.1016/j.cie.2015.07.012
Date:
July, 2015
Файл:
PDF, 991 KB
english, 2015