Application of the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Film for High-Resolution Transmission Electron Microscope Observation
Tarutani, Masayoshi, Takai, Yoshizo, Shimizu, RyuichiТом:
31
Журнал:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.31.L1305
Date:
September, 1992
Файл:
PDF, 1.65 MB
1992
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