Microscale thermal characterization at temperatures up to 1000°C by photoreflectance microscopy. Application to the characterization of carbon fibres
Rochais, D, Houëdec, H Le, Enguehard, F, Jumel, J, Lepoutre, FТом:
38
Мова:
english
Журнал:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/38/10/002
Date:
May, 2005
Файл:
PDF, 1.12 MB
english, 2005