SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II - Spectroscopy with electronic terahertz techniques
van der Weide, Daniel W., Murakowski, Janusz A., Keilmann, Fritz, Chamberlain, J. MartynТом:
3828
Рік:
1999
Мова:
english
DOI:
10.1117/12.361046
Файл:
PDF, 435 KB
english, 1999