SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Operational Characteristics and Crystal Growth of Nonlinear Optical Materials - Nonlinear absorption and laser damage threshold measurements of doped ZnGeP2
Guha, Shekhar, Bartsch, Mark, Hopkins, Frank K., Eaton, Michael P., Setzler, Scott D., Schunemann, Peter G., Pollak, Thomas M., Lal, Ravindra B., Frazier, Donald O.Том:
3793
Рік:
1999
Мова:
english
DOI:
10.1117/12.351408
Файл:
PDF, 186 KB
english, 1999
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