SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - Nanofocused x-ray beams applied for mapping strain in core-shell nanowires
Lai, Barry, Stankevič, Tomaš, Dzhigaev, Dmitry, Bi, Zhaoxia, Rose, Max, Shabalin, Anatoly, Reinhardt, Juliane, Mikkelsen, Anders, Samuelson, Lars, Falkenberg, Gerald, Vartanyants, Ivan A., Feidenhans'Том:
9592
Рік:
2015
Мова:
english
DOI:
10.1117/12.2190693
Файл:
PDF, 2.20 MB
english, 2015
File converter
Більше результатів пошуку
More benefits 
