[IEEE 2015 10th European Microwave Integrated Circuits Conference (EuMIC) - Paris, France (2015.9.7-2015.9.8)] 2015 10th European Microwave Integrated Circuits Conference (EuMIC) - Multi-bias nonlinear characterization of GaN FET trapping effects through a multiple pulse time domain network analyzer
Santarelli, Alberto, Cignani, Rafael, Niessen, Daniel, Gibiino, Gian Piero, Traverso, Pier Andrea, Schreurs, Dominique, Filicori, FabioРік:
2015
Мова:
english
DOI:
10.1109/EuMIC.2015.7345073
Файл:
PDF, 748 KB
english, 2015
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