Mapping of Defects in Individual Silicon Nanocrystals Using Real-Space Spectroscopy
Kislitsyn, Dmitry A., Kocevski, Vancho, Mills, Jon M., Chiu, Sheng-Kuei, Gervasi, Christian F., Taber, Benjamen N., Rosenfield, Ariel E., Eriksson, Olle, Rusz, Ján, Goforth, Andrea M., Nazin, George VМова:
english
Журнал:
The Journal of Physical Chemistry Letters
DOI:
10.1021/acs.jpclett.6b00176
Date:
March, 2016
Файл:
PDF, 9.50 MB
english, 2016