SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Next-Generation Spectroscopic Technologies V - Investigation of optically injected charge carrier dynamics in silicon wafers using terahertz spectroscopic imaging
Arnold, Thomas, Druy, Mark A., Crocombe, Richard A., De Biasio, Martin, Muehleisen, Wolfgang, Leitner, RaimundТом:
8374
Рік:
2012
Мова:
english
DOI:
10.1117/12.919061
Файл:
PDF, 1.49 MB
english, 2012