SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Modeling Aspects in Optical Metrology V - Research of the use of autoreflection scheme to measure the error of the optical elements in space telescope’s relative position
Bodermann, Bernd, Frenner, Karsten, Silver, Richard M., Ezhova, Kseniia, Molev, Fedor, Konyakhin, IgorТом:
9526
Рік:
2015
Мова:
english
DOI:
10.1117/12.2184602
Файл:
PDF, 319 KB
english, 2015