[IEEE Fifth World Congress on Intelligent Control and Automation (IEEE Cat. No.04EX788) - Hangzhou, China (June 15-19, 2004)] Fifth World Congress on Intelligent Control and Automation (IEEE Cat. No.04EX788) - Chemical process monitoring and fault diagnosis based on independent component analysis
Guo-jin Chen,, Jun Liang,, Ji-xin Qian,Том:
2
Рік:
2004
Мова:
english
DOI:
10.1109/wcica.2004.1340933
Файл:
PDF, 287 KB
english, 2004