Application of fast sensors to microscope mode spatial imaging mass spectrometry
Brouard, M, Johnsen, A J, Nomerotski, A, Slater, C S, Vallance, C, Yuen, W HТом:
6
Мова:
english
Журнал:
Journal of Instrumentation
DOI:
10.1088/1748-0221/6/01/c01044
Date:
January, 2011
Файл:
PDF, 791 KB
english, 2011